KASN15F

Temporary

Microscopic Characterization of Materials

7.5

Course given jointly for second and third cycle

7719 (Centre for Analysis and Synthesis (CAS))

2025-09-15

Jens Wahlström

English

Once every semester

to acquire and compile knowledge on current methods of element analysis on nanometer scale
to understand the processes behind the different methods of analysis
to be able to execute an analysis in practice

* Elastic and inelastic scattering
* Magnetic lenses
* Principles and functions of different types of electron microscopes (TEM, SEM)
* Diffraction
* Contrast mechanisms for imaging
* Spectrometers for element analysis, Energy dispersive x-ray spectrometer (XEDS), Electron energy ions spectrometer (EELS)
* Identification and quantification of spectra.

be able to apply his/her knowledge on electron structure in order to predict properties like x-ray emission and Auger electron emission
understand elastic and inelastic electron scattering in solid materials
understand the principles of imaging with various methods of microscopy
understand the working mode of different detectors

be able to plan adequate preparation methods for various types of materials
apply his/her knowledge on choosing adequate methods for analysis of certain materials
be able to analyse images and spectra of various types of materials, both quality and quantity
independently execute analysis according to plan

be able to evaluate accuracy and precision with the various methods of analysis
be able to explain artefacts and sources of errors
demonstrate the ability to plan and execute analysis of unknown materials

Lectures

Laboratory exercises

Project

Oral exam

Written report

Seminars given by participants

Failed, pass

Basic knowledge of optics and materials chemistry. Basic course in analysis at the nanoscale, or some practical experience of electron microscopy, is advantageous, but not a requirement.

The course is together with KASN15 (for MSc students) limited to 12 participants. Priority is based on need of PhD students to start independent access to the electron microscopy facilities.

Williams, David B. & Carter, C. Barry: Transmission Electron Microscopy: A Textbook for Materials Science. Springer Science & Business Media, 2009. ISBN 9780387765006.

Available as ebook

KASN15F

2025-09-15

Jens Wahlström